TB 9-6625-2240-35
Table 14. High Frequency Compensation Adjustments - Continued
Oscilloscope calibrator
EDGE settings
Test instrument
Aberration limits
TIME/DIV
minor division or
CH1
switch
Portion of
minor division
adjustments
settings
pk-pk
AMPLITUD
(R)
(s)
affected
(<)
E
1
R109 (fig. 1)1
200 mVpp
10 kHz
20
Top and corner
10
R139 (fig. 1)
5
R475 (fig. 2)2,3
1
R494 (fig. 2)3
1Test
instrument with SN B250000 and above.
2Optional
on some test instruments.
3Affect both CH1 and CH2. Readjust as necessary.
(6) Remove TI connection from CH1 and connect to CH2 and press VERT MODE
CH2 pushbutton (in).
(7) Set TI VOLTS/DIV CH2 switch to 5m (10m for Tektronix, Type 475A).
(8) Use technique of step 9 below for TI settings and oscilloscope calibrator output
listed in table 15.
(9) Rotate oscilloscope calibrator knob below EDIT FIELD pushbutton to adjust
amplitude for 5 divisions of vertical deflection on TI. Square wave will have aberrations not
Oscilloscope calibrator
EDGE
Test
settings
instrument
Aberration limits
minor division or
CH2
TIME/DIV
Portion of
minor division
adjustments
switch settings
pk-pk
AMPLITUD
FREQUENC
(R)
(S)
affected
(<)
E
Y
10 ns from
200 mVpp
1 MHz
0.1
1
C275, R275 (fig. 1)
leading edge
0.05
2 ns from
C233, R233 (fig. 1)
leading edges
Front corner
C212, R212 (fig. 1
200 mVpp
100 kHz
0.5
1
Top and corner
1
R209 (fig. 1)1
200 mVpp
10 kHz
20
Top and corner
10
R239 (fig. 1)
5
R475 (fig. 2)2,3
1
R494 (fig. 2)3
1Test
instrument with SN B250000 and above.
2Optional
on some test instruments.
3Affect both CH1 and CH2. Readjust as necessary.
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